The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2019
Filed:
Feb. 16, 2017
Applicant:
Inficon, Inc., East Syracuse, NY (US);
Inventors:
Shawn Michael Briglin, Cazenovia, NY (US);
Katherine Abigail Bartholomew, Syracuse, NY (US);
Assignee:
Inficon, Inc., East Syracuse, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/22 (2006.01); G01N 27/64 (2006.01); G01N 30/72 (2006.01); G01N 30/06 (2006.01); G01N 30/86 (2006.01); G01N 30/64 (2006.01);
U.S. Cl.
CPC ...
G01N 27/64 (2013.01); G01N 30/06 (2013.01); G01N 30/7206 (2013.01); G01N 30/8658 (2013.01); G01N 1/2247 (2013.01); G01N 1/2273 (2013.01); G01N 2001/2285 (2013.01); G01N 2030/067 (2013.01); G01N 2030/642 (2013.01);
Abstract
A system and method for chemical analysis are described herein. The system includes a probe, a sample collection cartridge, and a chemical analyzer. The probe is configured to collect the optimal amount of sample for a future analysis and to store this chemical sample in the sample collection cartridge. The probe also collects sample data. The chemical analyzer is configured to determine the optimal analysis settings based on the sample data and analyze the chemical sample stored in the sample collection cartridge based on the optimal analysis settings.