The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2019

Filed:

Jul. 18, 2016
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Nico Presser, Jena, DE;

Martin Mueller, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 40/14 (2006.01); G01J 1/46 (2006.01); G02B 21/00 (2006.01); H03F 3/08 (2006.01); H03G 5/28 (2006.01); H03G 5/14 (2006.01);
U.S. Cl.
CPC ...
G01J 1/46 (2013.01); G02B 21/008 (2013.01); H03F 3/087 (2013.01); H03G 5/28 (2013.01); H03G 5/14 (2013.01);
Abstract

A laser scanning microscope for laser scanning a sample is provided. The laser scanning microscope includes a scanner that is operated at a predefined scanning speed and that is configured to change a direction of illumination light generated to illuminate the sample. A detector is configured to detect light that is returned from the sample and an amplifier assembly is connected to the detector and is configured to amplify a detection signal that is generated by the detector. The amplifier assembly includes an adjustable capacitor and a capacitance of the adjustable capacitor is adjusted depending on the scanning speed of the scanner.


Find Patent Forward Citations

Loading…