The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2019
Filed:
Aug. 08, 2011
Margaret R. Charlebois, Jericho, VT (US);
Rashmi D. Chatty, Oviedo, FL (US);
Christopher D. Hanudel, Essex Junction, VT (US);
Robert D. Herzl, South Burlington, VT (US);
David W. Milton, Underhill, VT (US);
Clarence R. Ogilvie, Huntington, VT (US);
Matthew P. Szafir, Williston, VT (US);
Tad J. Wilder, South Hero, VT (US);
Margaret R. Charlebois, Jericho, VT (US);
Rashmi D. Chatty, Oviedo, FL (US);
Christopher D. Hanudel, Essex Junction, VT (US);
Robert D. Herzl, South Burlington, VT (US);
David W. Milton, Underhill, VT (US);
Clarence R. Ogilvie, Huntington, VT (US);
Matthew P. Szafir, Williston, VT (US);
Tad J. Wilder, South Hero, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Embodiments of the invention provide a method, system, and program product for predicting a delay of a critical path. In one embodiment, the invention provides a method of predicting a delay of at least one critical path of an integrated circuit, the method comprising: determining a delay of at least one ring oscillator on the integrated circuit; and calculating a predicted delay for the at least one critical path delay based on a delay of components of the critical path at a corner condition, a wire delay of the at least one critical path, a delay of the at least one ring oscillator at a corner condition, and the determined delay of the at least one ring oscillator.