The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2019

Filed:

Sep. 15, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Vinod Bussa, Hyderabad, IN;

Manoj Dusanapudi, Bangalore, IN;

Shakti Kapoor, Austin, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/273 (2006.01); G06F 11/22 (2006.01); G06F 11/36 (2006.01); G06F 11/263 (2006.01); G06F 11/16 (2006.01);
U.S. Cl.
CPC ...
G06F 11/273 (2013.01); G06F 11/167 (2013.01); G06F 11/2236 (2013.01); G06F 11/2273 (2013.01); G06F 11/263 (2013.01); G06F 11/3688 (2013.01);
Abstract

A transactional memory test tests a transactional memory system on a computer processor. A test case with a transactional memory test is constructed such that the transactional memory test proceeds further in the transaction mode if the transaction is successful. In contrast, if there is a failure of the transaction, then the transactional memory test is executed in the non-transaction state. The transactional memory test stresses both transaction success and transaction failure cases of the processor for more efficient validation of the computer processor. Also, when checking the correctness of the test case the correct result remains the same whether the transaction passes or fails to simplify verification.


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