The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2018
Filed:
Dec. 14, 2016
Leica Geosystems Ag, Heerbrugg, CH;
Bernhard Metzler, Dornbirn, AT;
Beat Aebischer, Heerbrugg, CH;
Knut Siercks, Mörschwil, CH;
Siegfried Wiltsche, Wolfurt, AT;
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Abstract
Some embodiments of the invention relate to a method for capturing a relative position of at least one first spatial point by means of a portable distance measuring device, the method comprising positioning a known reference object, which has known features which may be captured by optical means, said features being arranged in a pattern designed for a resection, at least one first measuring process, comprising measuring a first distance to the first spatial point, and recording a first reference image linked in time with measuring the first distance, the reference object being imaged in the first reference image, and ascertaining the position and orientation of the distance measuring device relative to the reference object comprising identifying the reference object, recalling stored information about the known features of the identified reference object and identifying positions of known features of the reference object in the first reference image.