The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2018
Filed:
Feb. 21, 2018
Rigaku Corporation, Tokyo, JP;
Shinya Hara, Takatsuki, JP;
Takashi Matsuo, Takatsuki, JP;
Yasujiro Yamada, Takatsuki, JP;
Hisashi Honma, Takatsuki, JP;
Yoshiyuki Kataoka, Takatsuki, JP;
Rigaku Corporation, Akishima-shi, Tokyo, JP;
Abstract
A quantitative analysis condition setting unit () included in a sequential X-ray fluorescence spectrometer according to the present invention: performs qualitative analyses of a plurality of standard samples (); sets, on the basis of the qualitative analysis results, a peak measurement angle of each measurement line for analytical samples () in quantitative analysis conditions; and obtains a single virtual profile by synthesizing peak profiles of the plurality of standard samples () subjected to the qualitative analyses and sets, on the basis of the virtual profile and a preset half value width of the peak profile, background measurement angles of each measurement line for the analytical samples () in the quantitative analysis conditions.