Crystalline phase identification method, crystalline phase identification device, and x-ray diffraction measurement system

Abstract

A crystalline phase contained in a sample is identified, from X-ray diffraction data of the sample which contain data of a plurality of ring-shaped diffraction patterns, using a database in which are registered data related to peak positions and peak intensity ratios of X-ray diffraction patterns for a plurality of crystalline phases. Peak positions and peak intensities for a plurality of the diffraction patterns are detected from the X-ray diffraction data (step), and the circumferential angle versus intensity data of the diffraction patterns is created (step). The diffraction patterns are grouped into a plurality of clusters on the basis of the circumferential angle versus intensity data (step). Crystalline phase candidates contained in the sample are searched from the database on the basis of sets of ratios of peak positions and peak intensities of the diffraction patterns grouped into the same cluster (step).