The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2018

Filed:

Mar. 06, 2017
Applicant:

Mikro Mesa Technology Co., Ltd., Apia, WS;

Inventors:

Li-Yi Chen, Tainan, TW;

Pei-Yu Chang, Tainan, TW;

Hsin-Wei Lee, Tainan, TW;

Chun-Yi Chang, Tainan, TW;

Shih-Chyn Lin, Tainan, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 33/14 (2010.01); H01L 33/34 (2010.01); H01L 33/00 (2010.01); H01L 23/00 (2006.01); H01L 33/38 (2010.01); H01L 33/44 (2010.01); H01L 25/075 (2006.01);
U.S. Cl.
CPC ...
H01L 33/14 (2013.01); H01L 24/83 (2013.01); H01L 33/0054 (2013.01); H01L 33/0079 (2013.01); H01L 33/145 (2013.01); H01L 33/343 (2013.01); H01L 33/38 (2013.01); H01L 33/44 (2013.01); H01L 25/0753 (2013.01); H01L 2224/83191 (2013.01); H01L 2924/0002 (2013.01); H01L 2933/0016 (2013.01); H01L 2933/0025 (2013.01);
Abstract

A method for manufacturing a light-emitting diode (LED) includes plural steps as follows. A first type semiconductor layer is formed. A second type semiconductor layer is formed on the first type semiconductor layer. An impurity is implanted into a first portion of the second type semiconductor layer. The concentration of the impurity present in the first portion of the second type semiconductor layer is greater than the concentration of the impurity present in a second portion of the second type semiconductor layer after the implanting, such that the resistivity of the first portion of the second type semiconductor layer is greater than the resistivity of the second portion of the second type semiconductor layer.


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