The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2018

Filed:

Aug. 20, 2017
Applicant:

United Microelectronics Corp., Hsin-Chu, TW;

Inventors:

Sheng-Hsu Liu, Changhua County, TW;

Jhen-cyuan Li, New Taipei, TW;

Chih-Chung Chen, Tainan, TW;

Man-Ling Lu, Taoyuan, TW;

Chung-Min Tsai, Tainan, TW;

Yi-Wei Chen, Taichung, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01); H01L 29/06 (2006.01); H01L 29/165 (2006.01); H01L 29/66 (2006.01); H01L 21/764 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7851 (2013.01); H01L 21/764 (2013.01); H01L 29/0649 (2013.01); H01L 29/0692 (2013.01); H01L 29/165 (2013.01); H01L 29/66795 (2013.01); H01L 29/7848 (2013.01); Y02E 10/50 (2013.01);
Abstract

A fin structure for a semiconductor device, such as a FinFET structure, has first and second semiconductor layers and an air gap between the layers. The second semiconductor layer includes a recessed portion, the air gap is located in the recessed portion, and the recessed portion has an upwardly-opening acute angle in the range from about 10° to about 55°. The air gap may prevent current leakage. A FinFET device may be manufactured by first recessing and then epitaxially re-growing a source/drain fin, with the regrowth starting over a tubular air gap.


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