The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2018

Filed:

May. 04, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Alberto Valdes Garcia, Chappaqua, NY (US);

Dirk Pfeiffer, Croton on Hudson, NY (US);

Fengnian Xia, Plainsboro, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 19/02 (2006.01); C23C 16/56 (2006.01); C23C 16/26 (2006.01); C30B 23/02 (2006.01); C30B 25/02 (2006.01); C30B 33/00 (2006.01); G06K 19/06 (2006.01);
U.S. Cl.
CPC ...
G06K 19/02 (2013.01); C23C 16/26 (2013.01); C23C 16/56 (2013.01); C30B 23/02 (2013.01); C30B 25/02 (2013.01); C30B 33/00 (2013.01); G06K 19/06037 (2013.01); G06K 19/06046 (2013.01);
Abstract

A system for labeling an object uses at least one object label made from a material that absorbs and reflects incident energy uniformly across all wavelengths of incident energy at a ratio proportional to a thickness of the material and that includes a pattern having variations in the thickness of the material along at least one of two orthogonal directions across the label. An interrogator directs a predetermined wavelength of radiation to the at least one label, and a reader to receives reflected radiation from the label at the predetermined wavelength and interprets the reflected radiation to recognize the pattern.


Find Patent Forward Citations

Loading…