The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2018

Filed:

Aug. 01, 2016
Applicant:

Freescale Semiconductor, Inc., Austin, TX (US);

Inventors:

Khurram Waheed, Austin, TX (US);

Kevin Traylor, Austin, TX (US);

Mihai-Ionut Stanciu, Bucharest, RO;

Assignee:

NXP USA, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/00 (2006.01); H04B 1/7097 (2011.01); H04B 1/7075 (2011.01); H04B 1/709 (2011.01);
U.S. Cl.
CPC ...
H04B 1/7097 (2013.01); H04B 1/709 (2013.01); H04B 1/70752 (2013.01); H04B 2201/709709 (2013.01);
Abstract

Circuits and methods concerning signal detection are disclosed. In some example embodiments, an apparatus is configured to detect presence of a spreading sequence in a sample data sequence. Phase differences between samples in a sample sequence are determined. Presence of a spreading sequence in the sample sequence is detected by evaluating correlation of reference sub-sequences, of a reference spreading sequence, to the phase differences between samples in a sample sequence. Each of the reference sub-sequences includes fewer chips than the spreading sequence to be detected.


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