The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2018
Filed:
Jan. 05, 2012
Yuk Ming Dennis Lo, Kowloon, HK;
Wai Kwun Rossa Chiu, Shatin, HK;
Kwan Chee Chan, Kowloon, HK;
BO Yin Tsui, Ma On Shan, CN;
Yuk Ming Dennis Lo, Kowloon, HK;
Wai Kwun Rossa Chiu, Shatin, HK;
Kwan Chee Chan, Kowloon, HK;
Bo Yin Tsui, Ma On Shan, CN;
The Chinese University of Hong Kong, Shatin, New Territories, HK;
Abstract
Methods, apparatuses, and system are provided for analyzing a maternal sample to determine whether a male fetus of a pregnant female has inherited an X-linked mutation from the mother. A percentage of fetal DNA in the sample is obtained, and cutoff values for the two possibilities (fetus inherits mutant or normal allele) are determined. A proportion of mutant alleles relative to a normal allele on the X-chromosome can then be compared to the cutoff values to make a classification of which allele is inherited. Alternatively, a number of alleles from a target region on the X-chromosome can be compared to a number of alleles from a reference region on the X-chromosome to identify a deletion or amplification. The fetal DNA percentage can be computed by counting reactions with a fetal-specific allele, and correcting the number to account for a statistical distribution among the reactions.