The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2018

Filed:

Jul. 17, 2015
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Kenichi Hirami, Tokyo, JP;

Kazuhiro Nakamura, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/02 (2006.01); G01N 35/04 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/026 (2013.01); G01N 35/0095 (2013.01); G01N 35/04 (2013.01); G01N 2035/0094 (2013.01); G01N 2035/0412 (2013.01); G01N 2035/0462 (2013.01); G01N 2035/0465 (2013.01);
Abstract

An automatic analyzing apparatus capable of obtaining an analysis result of a specimen high in urgency in a shorter time is provided. When a first rackis present in a sampling lineand an analysis request for a second rack higher in the degree of urgency for analysis than the first rackis detected, a control unit unloads the first rackonto a transport linethrough a return line, allows the first rackto stand by at a rack standby positionon a transport linebetween a loading lineand the return lineunder control, and loads the second rack from the transport lineonto the sampling linethrough the loading lineand transports the second rack to the dispensing positionunder control while allowing the first rackto stand by.


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