The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2018

Filed:

Nov. 11, 2016
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventor:

Eiji Takeda, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04B 17/309 (2015.01);
U.S. Cl.
CPC ...
H04B 17/0085 (2013.01); H04B 17/309 (2015.01);
Abstract

A measurement deviceincludes a measurement sectionand the like, and the measurement sectionincludes an SAthat receives a signal for measuring transmission characteristics with a frequency in a predetermined frequency band from a DUT, an SGthat outputs a signal for measuring reception characteristics with a frequency in a predetermined frequency band to the DUT, a band storage sectionthat stores information on a frequency band handled by the measurement section, and a band setting sectionthat sets a frequency band handled by the SAand the SGon the basis of information of a frequency band handled by other measurement sections, and


Find Patent Forward Citations

Takeda, Eiji. (2018). Measurement device and measurement method (U.S. Patent No. 10142037). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10142037

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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