The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2018
Filed:
Oct. 18, 2016
Topcon Corporation, Tokyo-to, JP;
Masaki Kamiki, Tokyo-to, JP;
Goro Iwasaki, Tokyo-to, JP;
Shinji Yamaguchi, Tokyo-to, JP;
Satoshi Yanobe, Tokyo-to, JP;
Eiji Takeuchi, Tokyo-to, JP;
Yosuke Okudaira, Tokyo-to, JP;
TOPCON Corporation, Tokyo-to, JP;
Abstract
The present invention provides a measuring device, which comprises a leveling unit, a measuring device main body provided on the leveling unit, a control unit, a first tilt angle measuring device for detecting a horizontality with high accuracy, and a second tilt angle measuring device for detecting a tilt angle in a wider range than a range of the first tilt angle measuring device and having a higher responsiveness than a responsiveness of the first tilt angle measuring device, wherein the control unit, the first tilt angle measuring device and the second tilt angle measuring device are provided in the measuring device main body and wherein the control unit drives the leveling unit based on a detection result of the second tilt angle measuring device, performs a rough leveling until a tilt angle detected by the second tilt angle measuring device reaches within a range in which the first tilt angle measuring device is capable of detecting and levels the measuring device main body horizontally based on a detection result of the first tilt angle measuring device.