The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2018

Filed:

Jan. 05, 2018
Applicant:

Varian Semiconductor Equipment Associates, Inc., Gloucester, MA (US);

Inventors:

Bon-Woong Koo, Andover, MA (US);

Yong-Seok Hwang, Seoul, KR;

Kyong-Jae Chung, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); H01J 27/16 (2006.01); H01J 37/08 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32458 (2013.01); H01J 27/16 (2013.01); H01J 37/08 (2013.01); H01J 37/321 (2013.01); H01J 37/3211 (2013.01); H01J 37/3244 (2013.01); H01J 37/32412 (2013.01); H01J 37/32422 (2013.01); H01J 37/32449 (2013.01); H01J 37/32623 (2013.01); H01J 37/32669 (2013.01); H01J 2237/327 (2013.01); H01J 2237/3365 (2013.01);
Abstract

Provided herein are approaches for dynamically modifying plasma volume in an ion source chamber by positioning an end plate and radio frequency (RF) antenna at a selected axial location. In one approach, an ion source includes a plasma chamber having a longitudinal axis extending between a first end wall and a second end wall, and an RF antenna adjacent a plasma within the plasma chamber, wherein the RF antenna is configured to provide RF energy to the plasma. The ion source may further include an end plate disposed within the plasma chamber, adjacent the first end wall, the end plate actuated along the longitudinal axis between a first position and a second position to adjust a volume of the plasma. By providing an actuable end plate and RF antenna, plasma characteristics may be dynamically controlled to affect ion source characteristics, such as composition of ion species, including metastable neutrals.


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Koo, Bon-Woong. (2018). Rf ion source with dynamic volume control (U.S. Patent No. 10134568). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10134568

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