The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2018
Filed:
Nov. 13, 2017
Visuray Intech Ltd (Bvi), Road Town, Tortola, VG;
Melissa Spannuth, Houston, TX (US);
David Ponce, Randaberg, NO;
Ådne Voll, Stavanger, NO;
Henning Torsteinsen, Voll, NO;
Morteza Esmaeili, Stavanger, NO;
Spencer Gunn, London, GB;
Visuray Intech Ltd (BVI), Road Town, VG;
Abstract
Methods of reconstructing the surface topography of an object embedded in a scattering medium are provided, with example methodologies including: imaging an object embedded in a signal scattering medium using a scattered signal detector; detecting changes in the magnitude of a plurality of scattered signals obtained from multiple fields of view within the medium; and constructing an image of the surface topography of the object based on said plurality of detected signal magnitude changes. A plurality of system, apparatus, control means, evaluation methods, and materials and components useful for practicing the methods are also disclosed.