The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2018

Filed:

May. 11, 2017
Applicant:

Infineon Technologies Austria Ag, Villach, AT;

Inventors:

Clemens Ostermaier, Villach, AT;

Juergen Bostjancic, Ludmannsdorf, AT;

Gerhard Raczynski, Landskron, AT;

David Kammerlander, Villach, AT;

Gerhard Prechtl, St. Jakob i. Rosental, AT;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/20 (2006.01); G01R 1/073 (2006.01); G01R 33/12 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2831 (2013.01); G01R 1/07342 (2013.01); G01R 1/20 (2013.01); G01R 33/12 (2013.01);
Abstract

A probe test card for testing semiconductor devices includes a printed circuit board, a pair of electrically conductive probes extending towards one another and protruding away from the printed circuit board with a gap being disposed between ends of the pair of electrically conductive probes, and a coil affixed to and electrically connected to the printed circuit board and disposed directly over the gap. The probe test card is configured to generate a magnetic flux in the gap between the ends of the pair of electrically conductive probes upon the application of a current through the coil.


Find Patent Forward Citations

Loading…