The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2018
Filed:
Oct. 20, 2017
Olympus Corporation, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A method of measuring scanning characteristics of an optical scanning apparatus allows measurement of scanning characteristics of an actuator. The method includes bringing a tip of the optical scanning apparatus and a chart for measuring scanning characteristics closer together and irradiating illumination light with the actuator in a non-driven state, separating the tip and the chart for measuring scanning characteristics by a predetermined distance while maintaining the relative orientations thereof, and adjusting a drive signal of the actuator so that a scanning area of the illumination light on the chart for measuring scanning characteristics can form a desired shape. At least one of an angle of deviation and a viewing angle is measured using an irradiation position of the illumination light on the chart for measuring scanning characteristics.