The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2018
Filed:
Jun. 05, 2017
Tektronix, Inc., Beaverton, OR (US);
Steven A. Jacobs, Madison, WI (US);
Robert A. Marsland, Jr., Madison, WI (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
A test and measurement system is disclosed. The system includes a data store with a data description of a received in-phase (I) quadrature (Q) symbol. The received IQ symbol is received from a transmitter associated with impairments, and the received IQ symbol is modified from a corresponding ideal IQ symbol by the impairments. A computer processor is coupled to the data store and generates an Error-Vector Magnitude (EVM) function that describes a difference between the received IQ symbol and the ideal IQ symbol in terms of a plurality of impairment parameters indicating the impairments. The processor then determines values for the impairment parameters that quantify the impairments. The values are determined by selection of values for the impairment parameters that minimize the EVM function.