The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2018

Filed:

Sep. 29, 2015
Applicant:

Agency for Science, Technology and Research, Singapore, SG;

Inventors:

Chao Jin, Singapore, SG;

Weiya Xi, Singapore, SG;

Khai Leong Yong, Singapore, SG;

Shibin Chen, Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H03M 13/11 (2006.01); H03M 13/03 (2006.01); H03M 13/37 (2006.01); H03M 13/05 (2006.01);
U.S. Cl.
CPC ...
H03M 13/1102 (2013.01); H03M 13/036 (2013.01); H03M 13/373 (2013.01); H03M 13/05 (2013.01);
Abstract

A method for defining an erasure code for system having a predetermined number of data disks is disclosed. The method includes selecting step, constructing step, determining step and repeating step. The selecting step includes selecting a predetermined acceptable number of failures for the system. The constructing step includes constructing a first Tanner graph for two failures acceptable system having predetermined number of data disks. The determining step includes determining erasure code from the first Tanner graph. The repeating step includes repeating the constructing step and the determining step by increasing the acceptable number of failures by one and constructing another Tanner graph in response to the increased acceptable number of failures by increasing number of parity nodes until the predetermined number of failures for the system is reached.


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