The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2018

Filed:

Nov. 29, 2016
Applicant:

Otsuka Electronics Co., Ltd., Osaka, JP;

Inventors:

Sota Okamoto, Koka, JP;

Hiroyuki Sano, Omihachiman, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/00 (2006.01); G02B 21/24 (2006.01); G01J 3/02 (2006.01); G02B 21/06 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/244 (2013.01); G01J 3/0208 (2013.01); G01J 3/0237 (2013.01); G02B 21/06 (2013.01); G02B 21/361 (2013.01);
Abstract

An optical characteristic measurement apparatus which can be reduced in size and can achieve enhanced versatility is provided. The optical characteristic measurement apparatus includes a first optical element which converts measurement light from a measurement target object to parallel light, a reflective lens which reflects the parallel light from the first optical element to convert the parallel light to convergent light, a light reception portion which receives the convergent light from the reflective lens, and a drive mechanism which varies a position of the first optical element relative to the measurement target object.


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