The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2018
Filed:
Nov. 28, 2017
Nxp Usa, Inc., Austin, TX (US);
Marius Octavian Arvinte, Bucharest, RO;
Andrei Alexandru Enescu, Bucharest, RO;
Leo Dehner, Austin, TX (US);
NXP USA, Inc., Austin, TX (US);
Abstract
A nonlinear MIMO-OFDM detector includes a vector arithmetic unit (VAU) that sequentially computes first metrics corresponding to a first current tree level of a first search tree and second metrics corresponding to a second current tree level of a second search tree. A sorting and indexing unit (SIU) that sorts the first metrics and the second metrics sequentially received from the VAU and that sequentially provides first indices of lowest first metrics and second indices of lowest second metrics to the vector arithmetic unit. The lowest first metrics are first inputs to the VAU for a first next tree level of the first search tree and the lowest second metrics are second inputs to the VAU for a second next tree level of the second search tree. The VAU and the SIU are pipelined to compute the second metrics concurrently with sorting and indexing of the first metrics.