The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

Sep. 26, 2017
Applicant:

Sandisk Technologies Llc, Plano, TX (US);

Inventors:

Seje Takaki, Yokkaichi, JP;

Jongsun Sel, Los Gatos, CA (US);

Hisakazu Otoi, Yokkaichi, JP;

Assignee:

SANDISK TECHNOLOGIES LLC, Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/06 (2006.01); H01L 47/00 (2006.01); H01L 45/00 (2006.01); H01L 27/24 (2006.01); H01L 27/105 (2006.01);
U.S. Cl.
CPC ...
H01L 45/1206 (2013.01); H01L 27/1052 (2013.01); H01L 27/249 (2013.01); H01L 27/2454 (2013.01); H01L 45/16 (2013.01);
Abstract

Dielectric wall structures are formed through a stack of a doped semiconductor material layer, a planar insulating spacer layer, and a sacrificial matrix layer. Gate electrode rails are formed through the dielectric wall structures and the sacrificial matrix layer. A two-dimensional array of rectangular openings is formed by removing remaining portions of the sacrificial matrix layer. A two-dimensional array of tubular gate electrode portions is formed in the two-dimensional array of rectangular openings. Gate dielectrics are formed on sidewalls of the tubular gate electrode portions. Vertical semiconductor channels are formed within each of the gate dielectrics by deposition of a semiconductor material. A two-dimensional array of vertical field effect transistors including surround gates is formed, which may be employed as access transistors of a three-dimensional memory device.


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