The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2018
Filed:
Dec. 31, 2016
Intel Corporation, Santa Clara, CA (US);
Robert F. Kwasnick, Palo Alto, CA (US);
Suraj Sindia, Hillsboro, OR (US);
Clark N. Vandam, Hillsboro, OR (US);
Balkaran Gill, Cornelius, OR (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
Apparatus, method, and system for remotely affecting the functionality and lifetime of an integrated circuit are described herein. One embodiment of a method includes: tracking a plurality of operational metrics relating to a monitored device, sending one or more of the plurality of operational metrics to a remote monitor and responsively receiving a command generated by the remote monitor, generating a threat level based on the plurality of operational metrics and the command, and performing a derating action based on the threat level. The command from the remote monitor may be generated by the remote monitor based, at least in part, on the one or more of the plurality of operational metrics. Alternatively, the command may be generated based on information obtained independently by the remote monitor and not based on the one or more of the plurality of operational metrics.