The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2018
Filed:
Dec. 19, 2014
Applicant:
Intel Corporation, Santa Clara, CA (US);
Inventors:
Daniel C. Middleton, Orono, MN (US);
Roger Jellicoe, San Mateo, CA (US);
Peter W. Winer, Los Altos, CA (US);
James Granger, Larkspur, CA (US);
Assignee:
INTEL CORPORATION, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/0488 (2013.01); G06F 3/0484 (2013.01); G06T 7/11 (2017.01); G06T 7/62 (2017.01); G06T 7/194 (2017.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06F 3/04883 (2013.01); G06F 3/04845 (2013.01); G06K 9/00671 (2013.01); G06T 7/11 (2017.01); G06T 7/194 (2017.01); G06T 7/62 (2017.01); G06T 2207/10012 (2013.01); G06T 2207/20101 (2013.01);
Abstract
Image location selection is described for use in a depth photography system. In one example, a method includes receiving a selection from a user of a position in a captured image, comparing the selected position to objects in the image, selecting whether the selected position is intended to be within an object or outside an object, refining the position based on the selection, and determining a depth for an object corresponding to the refined position.