The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Mar. 24, 2017
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

John P. Bettencourt, Danvers, MA (US);

Raghuveer Mallavarpu, Boxborough, MA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 27/06 (2006.01); H01L 21/8232 (2006.01); H01L 29/872 (2006.01); H01L 29/812 (2006.01); H01L 29/06 (2006.01); H01L 21/8234 (2006.01); H01L 29/10 (2006.01); H01L 29/20 (2006.01); H01L 29/47 (2006.01); H01L 29/778 (2006.01); H03F 1/56 (2006.01); H03F 3/195 (2006.01); H03F 3/213 (2006.01); H01L 29/08 (2006.01); H03F 1/32 (2006.01);
U.S. Cl.
CPC ...
H01L 27/0629 (2013.01); H01L 21/8232 (2013.01); H01L 21/823437 (2013.01); H01L 29/0696 (2013.01); H01L 29/0891 (2013.01); H01L 29/1095 (2013.01); H01L 29/2003 (2013.01); H01L 29/47 (2013.01); H01L 29/7787 (2013.01); H01L 29/812 (2013.01); H01L 29/872 (2013.01); H03F 1/3205 (2013.01); H03F 1/3276 (2013.01); H03F 1/56 (2013.01); H03F 3/195 (2013.01); H03F 3/213 (2013.01); H03F 2200/126 (2013.01); H03F 2200/222 (2013.01); H03F 2200/387 (2013.01); H03F 2200/451 (2013.01); H03F 2200/75 (2013.01);
Abstract

A structure having: a plurality of field effect transistors (FETs) connected between a common input and a common output, each one of the field effect transistors comprises: a source region, a drain region, and a gate electrode for controlling carriers through a channel region of a transistor region of the structure between the source region and the drain region; a plurality of diodes, each one of the diodes being associated with a corresponding one of the plurality of FETs, each one of the diodes having an electrode in Schottky contact with a diode region of the corresponding one of the FETs. The gate electrode and the diode electrode extend along parallel lines. The source region, the drain region, the channel region, and a diode region having therein the diode are disposed along a common line.


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