The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2018
Filed:
Apr. 20, 2016
Rigaku Corporation, Tokyo, JP;
Takuto Sakumura, Hachioji, JP;
Yasukazu Nakaye, Ome, JP;
RIGAKU CORPORATION, Tokyo, JP;
Abstract
Provided are an X-ray data processing apparatus and a method and a program therefor which can eliminate the influence of the phenomenon that the statistical variation of a count value after distribution is estimated differently from that at another position and can prevent the influence of correction from remaining. An X-ray data processing apparatusthat corrects the count value of X-ray intensity detected by a pixel array type detector includes a storage unitto store a correspondence relationship of the shape and the position of a virtual pixel with respect to the shape and the position of an actual pixel, and a distribution unitto distribute the count value of the actual pixel to the virtual pixel using a correspondence relationship in which randomness is provided to the stored correspondence relationship, and outputs the count value distributed to the virtual pixel as a correction result.