The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2018
Filed:
Aug. 31, 2012
Applicants:
Erkan Acar, Eugene, OR (US);
Pooya Tadayon, Portland, OR (US);
Armen Y. Balian, Portland, OR (US);
Ethan Caughey, Portland, OR (US);
Inventors:
Erkan Acar, Eugene, OR (US);
Pooya Tadayon, Portland, OR (US);
Armen Y. Balian, Portland, OR (US);
Ethan Caughey, Portland, OR (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); G01R 3/00 (2006.01); G01R 31/28 (2006.01); G01R 1/073 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2607 (2013.01); G01R 3/00 (2013.01); G01R 31/2889 (2013.01); G01R 1/07378 (2013.01); Y10T 29/49004 (2015.01); Y10T 29/49128 (2015.01);
Abstract
A test system includes a test printed circuit board (PCB), a flip chip package mounted on the PCB, one or more test probes coupled to the flip chip package and a first integrated circuit (IC) coupled to the test probes to enable testing of the first IC using electrical circuitry of the flip chip package.