The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2018
Filed:
Oct. 22, 2013
Applicant:
Egalax_empia Technology Inc., Taipei, TW;
Inventors:
Chin-Fu Chang, Taipei, TW;
Cheng-Han Lee, Taipei, TW;
Chi-Hao Tang, Taipei, TW;
Shun-Lung Ho, Taipei, TW;
Assignee:
EGALAX_EMPIA TECHNOLOGY INC., Taipei, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); G06F 3/041 (2006.01); G06F 3/044 (2006.01); G06F 3/0354 (2013.01); G06F 3/047 (2006.01);
U.S. Cl.
CPC ...
G01R 27/2605 (2013.01); G06F 3/03545 (2013.01); G06F 3/044 (2013.01); G06F 3/0416 (2013.01); G06F 3/0418 (2013.01); G06F 3/047 (2013.01);
Abstract
The method and device for analyzing position are disclosed. By analyzing sensing information with at least one zero-crossing, each position can be analyzed. The number of analyzed positions may be different from the number of zero-crossings. When the number of analyzed positions is different from the number of zero-crossing, the number of analyzed positions is more than one.
Chang, Chin-Fu. (2018). Method and device for analyzing positions (U.S. Patent No. 10101372). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10101372
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile