The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Apr. 03, 2013
Applicants:

Benjamin Samuel Pollack, Budd Lake, NJ (US);

Colin Mellars, Dover, NJ (US);

Baris Yagci, Whippany, NJ (US);

Inventors:

Benjamin Samuel Pollack, Budd Lake, NJ (US);

Colin Mellars, Dover, NJ (US);

Baris Yagci, Whippany, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/02 (2006.01); G01N 35/00 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/02 (2013.01); G01N 35/0095 (2013.01); G01N 2035/0093 (2013.01); G01N 2035/0406 (2013.01); G01N 2035/0472 (2013.01); Y10T 436/113332 (2015.01);
Abstract

Methods and systems for processing samples in an analyzer utilizes a track system with a plurality of track portions. A queue of samples for processing can be handled on a first portion, while priority samples may be handled on another portion. An instrument in a module may process samples in queues and priority samples. The instrument may process priority samples while a queue of samples remains on the first portion and resumes processing the queue of samples along the first portion upon completion of processing the priority sample.


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