The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2018

Filed:

Dec. 02, 2015
Applicant:

Intel Ip Corporation, Santa Clara, CA (US);

Inventors:

Zhibin Yu, Unterhaching, DE;

Tianyan Pu, Santa Clara, CA (US);

Qing Xu, Unterhaching, DE;

Assignee:

Intel IP Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04B 17/309 (2015.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04B 17/309 (2015.01);
Abstract

A method for performing reference signal measurements on a plurality of cells may include obtaining a plurality of channel quality metrics for the plurality of cells, assigning a plurality of cell measurement priority rankings to the plurality of cells based on the plurality of channel quality metrics, based on the plurality of cell measurement priority rankings, selecting one or more target cells from the plurality of cells to measure during one or more reference signal periods to obtain a plurality of reference signal measurements, and reporting the plurality of reference signal measurements to a communication network.


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