The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2018
Filed:
Sep. 29, 2016
Applicant:
Dr. Johannes Heidenhain Gmbh, Traunreut, DE;
Inventors:
Peter Speckbacher, Kirchweidach, DE;
Stefan Funk, Traunstein, DE;
Christian Baeuml, Traunwalchen, DE;
Assignee:
DR. JOHANNES HEIDENHAIN GmbH, Traunreut, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 7/182 (2006.01); G02B 5/18 (2006.01); G01B 11/14 (2006.01); G02B 1/11 (2015.01); G02B 5/08 (2006.01); G02B 1/115 (2015.01); G02B 5/20 (2006.01); G01D 5/38 (2006.01);
U.S. Cl.
CPC ...
G02B 5/1861 (2013.01); G01B 11/14 (2013.01); G02B 1/11 (2013.01); G02B 1/115 (2013.01); G02B 5/0816 (2013.01); G02B 5/0875 (2013.01); G02B 5/1814 (2013.01); G02B 5/1819 (2013.01); G02B 5/201 (2013.01); G01D 5/38 (2013.01);
Abstract
An optical layer system for a position-measuring device includes at least first, second and third functional surfaces disposed on a surface of a transparent substrate. Each of the functional surfaces have a different optical function. The functional surfaces are composed of a first layer stack and a second layer stack.