The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2018

Filed:

Oct. 03, 2016
Applicant:

Stmicroelectronics International N.v., Amsterdam, NL;

Inventor:

Danish Hasan Syed, New Delhi, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/3177 (2006.01); G01R 31/3181 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31727 (2013.01); G01R 31/3177 (2013.01); G01R 31/31705 (2013.01); G01R 31/31707 (2013.01); G01R 31/31724 (2013.01); G01R 31/31813 (2013.01);
Abstract

A system disclosed herein includes an on-chip clock controller (OCC) circuit receiving a test pattern and responsively generating output clock pulses in response to the test pattern. An OCC test circuit is coupled to the OCC circuit and configured to detect data corresponding to output clock pulses generated by the OCC controller circuit and generate corresponding OCC test outputs. A test output logic circuit is configured to receive the OCC test outputs from the OCC test circuit. A debug controller is operable to configure the test output logic circuit to output the OCC test outputs.


Find Patent Forward Citations

Syed, Danish. (2018). On-the-fly test and debug logic for atpg failures of designs using on-chip clocking (U.S. Patent No. 10094876). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10094876

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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