The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2018

Filed:

Aug. 30, 2016
Applicant:

Mitutoyo Corporation, Kanagawa, JP;

Inventors:

Takeshi Sawa, Kawasaki, JP;

Fumihiko Koshimizu, Zama, JP;

Assignee:

MITUTOYO CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/42 (2006.01);
U.S. Cl.
CPC ...
G01N 3/42 (2013.01); G01N 2203/0206 (2013.01);
Abstract

A hardness tester forms an indentation on a surface of a sample by loading a predetermined test force with an indenter and measures a hardness of the sample using the indentation. The hardness tester includes a light source emitting light on the surface of the sample and forming an illumination pattern having a spot; and a controller forming the indentation by bringing the indenter into contact with the sample in a state where a perpendicular line of a vertex of the indenter overlaps a test point when the position of the spot of the illumination pattern formed by the light source on the surface of the sample is used as the test point.


Find Patent Forward Citations

Loading…