The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2018

Filed:

May. 31, 2017
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Hui Zang, Guilderland, NY (US);

Jae Gon Lee, Waterford, NY (US);

Assignee:

GLOBALFOUNDRIES INC., Grand Cayman, KY;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01); H01L 21/8234 (2006.01); H01L 27/088 (2006.01); H01L 29/08 (2006.01); H01L 29/423 (2006.01); H01L 29/06 (2006.01); H01L 23/535 (2006.01);
U.S. Cl.
CPC ...
H01L 21/823462 (2013.01); H01L 21/823418 (2013.01); H01L 21/823437 (2013.01); H01L 21/823475 (2013.01); H01L 21/823481 (2013.01); H01L 21/823487 (2013.01); H01L 23/535 (2013.01); H01L 27/088 (2013.01); H01L 29/0649 (2013.01); H01L 29/0847 (2013.01); H01L 29/42368 (2013.01); H01L 29/42376 (2013.01); H01L 29/7827 (2013.01);
Abstract

The disclosure is directed to an integrated circuit structure and methods of forming the same. The integrated circuit structure may include: a set of fins within an ILD layer on a substrate; a first gate dielectric over the substrate and extending along opposing sidewalls of each fin in the set of fins, a metal stack adjacent to the first gate dielectric and on the opposing sidewalls of each fin, the metal stack having a first portion over the substrate and a second portion contacting the first gate dielectric and extending along the opposing sidewalls of each fin, wherein at least the first portion of the metal stack and a portion of the first gate dielectric above the substrate is replaced by another dielectric material; a set of epitaxial regions within the ILD layer; and a conductor within the ILD layer and extending over each epitaxial region.


Find Patent Forward Citations

Zang, Hui. (2018). Vertical finfet structure and methods of forming same (U.S. Patent No. 10090204). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10090204

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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