The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2018

Filed:

Feb. 14, 2017
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Thomas Kalkbrenner, Jena, DE;

Saskia Pergande, Sulza, DE;

Tobias Kaufhold, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/26 (2006.01); G12B 5/00 (2006.01); G02B 21/34 (2006.01); G02B 7/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/26 (2013.01); G02B 21/34 (2013.01); G12B 5/00 (2013.01); G02B 7/005 (2013.01);
Abstract

An adjusting mechanism of a sample holder is provided. The adjusting mechanism includes a base with drives arranged thereon, and a carrier that is adjustable by means of the drives and is designed to receive the sample holder. A coupling element for each drive, which coupling element is designed to connect the base and the carrier. Each coupling element has at least one linear degree of freedom and also a rotary degree of freedom. The carrier is linearly movable, by means of the coupling elements, along a respective movement axis directed from the coupling element to the carrier. Also provided is a microscope that includes such an adjusting mechanism, along with a method for adjusting the orientation of a sample holder.


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