The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Jul. 22, 2016
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Japan Aerospace Exploration Agency, Tokyo, JP;
Hamamatsu Photonics K.k., Shizuoka, JP;
Daisuke Matsuura, Tokyo, JP;
Yoshikatsu Kuroda, Tokyo, JP;
Kei Gemba, Tokyo, JP;
Tadayuki Takahashi, Kanagawa, JP;
Shin Watanabe, Kanagawa, JP;
Shin'ichiro Takeda, Kanagawa, JP;
Hiroo Yamamoto, Shizuoka, JP;
Kazumasa Kosugi, Shizuoka, JP;
Kazuhisa Yamamura, Shizuoka, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
JAPAN AEROSPACE EXPLORATION AGENCY, Tokyo, JP;
HAMAMATSU PHOTONICS K.K., Shizuoka, JP;
Abstract
A radiation measuring apparatus () includes a scatterer detector (A), an absorber detector (B) and a processing unit (). Pixel electrodes () of the scatterer detector (A) and the absorber detector (B) are arranged such that a distance between centers of two neighbor pixel electrodes () is smaller than a mean free path of a recoil electron generated in the Compton scattering of an electromagnetic radiation. The processing unit () specifies and incidence direction of the electromagnetic radiation based on a recoiling direction to which the recoil electron recoils. In this way, an electron tracking-type Compton camera is realized which confines the incidence direction of the electromagnetic radiation by using the recoiling direction of the recoil electron in a Compton camera using a semiconductor detector.