The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2018

Filed:

Mar. 30, 2017
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Mayue Xie, Phoenix, AZ (US);

Zhiguo Qian, Chandler, AZ (US);

Jong-Ru Guo, Portland, OR (US);

Zhichao Zhang, Chandler, AZ (US);

Zuoguo Wu, San Jose, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2853 (2013.01); G01R 31/2884 (2013.01); G01R 31/2896 (2013.01);
Abstract

A die with a transmission circuit, a reception circuit, and a comparison circuit can be provided. The transmission circuit can be configured to transmit a first signal through a first channel at a first transmission rate and a first transmission amplitude. The reception circuit can be in communication with the transmission circuit through the first channel. The reception circuit can receive a second signal at a first reception rate and at a first reception amplitude. The comparison circuit can be in communication with the transmission circuit and the reception circuit. The comparison circuit can be configured to: determine a first rate error value, determine a first amplitude error value, compare the first rate error value with a rate threshold to determine a first rate error occurrence, and compare the first amplitude error value with an amplitude threshold to determine a first amplitude error occurrence.


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