The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2018

Filed:

May. 17, 2017
Applicant:

Mitutoyo Corporation, Kawasaki, Kanagawa, JP;

Inventors:

Kenji Okabe, Kanagawa, JP;

Tatsuya Nagahama, Kanagawa, JP;

Nobuya Kaneko, Kanagawa, JP;

Assignee:

MITUTOYO CORPORATION, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6456 (2013.01); G01N 21/6489 (2013.01); G01N 2021/6471 (2013.01); G01N 2201/024 (2013.01);
Abstract

A measurement system includes detachable parts, on which one filter module out of a plurality of filter modules including optical filters that each transmit different types of special light is detachably mounted, a specification part that specifies the optical filter of the one filter module mounted on the detachable parts, and a set value switching part that switches, according to the specified optical filter specified by the specification part, set values for adjustment used in a measurement using a specific optical filter.


Find Patent Forward Citations

Okabe, Kenji. (2018). Measurement system and method for switching set value for adjustment (U.S. Patent No. 10088420). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10088420

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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