The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2018

Filed:

Jun. 27, 2016
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Ming Jin, Fremont, CA (US);

Dennis P. O'Connor, Granite Bay, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H03M 13/37 (2006.01); G06F 11/10 (2006.01); G11C 29/52 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
H03M 13/3746 (2013.01); G06F 11/1068 (2013.01); G11C 29/52 (2013.01); H03M 13/3738 (2013.01); G11C 2029/0409 (2013.01); G11C 2029/0411 (2013.01);
Abstract

One example of erasure-assisted error correction code (ECC) decoding can include reading a codeword with a first trim level, reading the codeword with a second trim level, and reading the codeword with a third trim level. A first result from reading the codeword with the first trim level, a second result from reading the codeword with the second trim level, and a third result from reading the codeword with the third trim level can be accumulated. An erasure of a detected unit sequence can be computed. The detected unit sequence can be modified by changing a unit in a position of the detected unit sequence corresponding to a position of the erasure. The modified detected unit sequence can be ECC decoded.


Find Patent Forward Citations

Loading…