The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2018

Filed:

Aug. 01, 2016
Applicant:

Taiwan Semiconductor Manufacturing Company Limited, Hsinchu, TW;

Inventors:

Chan-Hong Chern, Palo Alto, CA (US);

Chun-Lin Tsai, Hsinchu, TW;

Mark Chen, Hsinchu County, TW;

King-Yuen Wong, Tuen Mun, HK;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 27/00 (2006.01); H01L 21/762 (2006.01); H01L 29/20 (2006.01); H01L 29/205 (2006.01); H01L 29/778 (2006.01); H01L 29/06 (2006.01); H01L 27/06 (2006.01); H01L 29/66 (2006.01); H01L 21/8252 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76283 (2013.01); H01L 21/8252 (2013.01); H01L 27/0605 (2013.01); H01L 29/0649 (2013.01); H01L 29/2003 (2013.01); H01L 29/205 (2013.01); H01L 29/66462 (2013.01); H01L 29/7787 (2013.01);
Abstract

Semiconductor structures including isolation regions and methods of forming the same are provided. A first layer is formed over a substrate, where the first layer comprises a semiconductor material. First and second trenches are etched, with each of the first and second trenches extending through the first layer and into the substrate. A wet etchant is introduced into the trenches, and the wet etchant etches a first opening below the first trench and a second opening below the second trench. Each of the first and second openings extends laterally below the first layer. The first and second openings are separated by a portion of the substrate adjoining the first and second openings. An oxidation process is performed to oxidize the portion of the substrate adjoining the first and second openings. An insulating material is deposited that fills the openings and the trenches.


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