The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2018

Filed:

Aug. 18, 2014
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventor:

Charles Carter Jernigan, Santa Clara, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 19/10 (2006.01); G01D 3/10 (2006.01); G01V 8/00 (2006.01); G01L 9/00 (2006.01); G01P 15/08 (2006.01); G01C 19/00 (2013.01); G01C 17/00 (2006.01);
U.S. Cl.
CPC ...
G01V 8/00 (2013.01); G01D 3/10 (2013.01); G01L 9/00 (2013.01); G01N 19/10 (2013.01); G01P 15/0802 (2013.01); G01C 17/00 (2013.01); G01C 19/00 (2013.01);
Abstract

Embodiments of the present disclosure provide techniques and configurations for an apparatus to reduce sensor power consumption, in particular, through predictive data measurements by one or more sensors. In one instance, the apparatus may include one or more sensors and a sensor management module coupled with the sensors and configured to cause the sensors to initiate measurements of data indicative of a process in a first data measurement mode, determine a pattern of events comprising the process based on a portion of the measurements collected by the sensors in the first data measurement mode over a time period, and initiate measurements of the data by the one or more sensors in a second data measurement mode. The second data measurement mode may be based on the pattern of events comprising the process. The pattern may indicate a prediction of appearance of events in the process. Other embodiments may be described and/or claimed.


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