The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2018

Filed:

Dec. 19, 2015
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Clark N. Vandam, Hillsoboro, OR (US);

Balkaran Gill, Cornelius, OR (US);

Junho Song, Portland, OR (US);

Suriya Suriya Ashok Kumar, Cupertino, CA (US);

Kasyap Pasumarthi, Cupertino, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/22 (2006.01); G06F 11/24 (2006.01); G06F 11/27 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 11/079 (2013.01); G06F 11/0721 (2013.01); G06F 11/0751 (2013.01); G06F 11/2236 (2013.01); G06F 11/24 (2013.01); G06F 11/27 (2013.01);
Abstract

An apparatus and method are described for an on-chip reliability controller. For example, one embodiment of a processor comprises: a set of one or more cores to execute instructions and process data; a reliability controller to perform one or more self-test/diagnostic operations, the reliability controller to aggregate reliability data resulting from the self-test/diagnostic operations; a reliability estimator integral to the reliability controller to use the aggregated reliability data to perform a probability analysis to determine reliability estimates for one or more components of the processor; and a control unit integral to the reliability controller to adjust one or more variables and/or circuitry related to operation of the processor responsive to the reliability estimates.


Find Patent Forward Citations

Loading…