The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2018
Filed:
Jun. 10, 2015
Hitachi High-technologies Corporation, Minato-ku, Tokyo, JP;
Takeshi Setomaru, Tokyo, JP;
Hideyasu Chiba, Tokyo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
The present invention achieves an automatic analysis device which has a probe guard for which the range of motion for accessing a specimen container installation section is small and which can be moved without being removed from a specimen installation section. The directions of movement of a probe guard are the vertical direction of a specimen container erection mechanism and the horizontal direction within an upper region of the specimen container erection mechanism, and a specimen container can be accessed without the need to move the probe guard to outside the upper region of the specimen container erection mechanism. Accordingly, it is possible to achieve an automatic analysis device which has a probe guard for which the range of motion for accessing a specimen installation section is small and which can be moved without being removed from a specimen container erection mechanism.