The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2018
Filed:
Mar. 17, 2015
Washington University, St. Louis, MO (US);
John J. Boyle, St. Louis, MO (US);
Guy M. Genin, St. Louis, MO (US);
Maiko Kume, St. Louis, MO (US);
Robert B. Pless, St. Louis, MO (US);
Stavros Thomopoulos, St. Louis, MO (US);
WASHINGTON UNIVERSITY, St. Louis, MO (US);
Abstract
A computer-implemented method for determining a quantification of the deformation of the sample is implemented using a computer device in communication with a memory. The method includes receiving, by the computer device, a first image of the sample and a second image of the sample. The method also includes registering the first image to the second image using a warping function. The warping function maps a plurality of pixels in the first image to a plurality of pixels in the second image. A first displacement field for the sample is determined based on the warping function, where the first displacement field includes at least a portion of the warping function. A first quantification of the deformation of the sample is determined based at least in part on the displacement field.