The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2018

Filed:

Dec. 20, 2015
Applicant:

Freescale Semiconductor, Inc., Austin, TX (US);

Inventors:

Girraj K. Agrawal, Noida, IN;

Arvind Kaushik, Ghaziabad, IN;

Vincent Martinez, Roques, FR;

Amrit P. Singh, Ludhiana, IN;

Assignee:

NXP USA, INC., Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 74/08 (2009.01); H04W 72/12 (2009.01);
U.S. Cl.
CPC ...
H04W 74/0833 (2013.01); H04W 72/1284 (2013.01);
Abstract

An apparatus for reception and detection of RACH data in an LTE input signal includes a hardware accelerator that has a decimator that filters and down-samples the input signal, a first Fourier transform circuit that transforms the decimated signal from the time domain to the frequency domain, and a second transform circuit that multiplies the resulting signal by a complex Z-C sequence and performs an inverse Fourier transform (iFT) operation to transform the multiplied signal from the frequency domain to the time domain. A DSP performs a delay profile analysis operation on the signal resulting from the iFT operation.


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