The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2018

Filed:

Jan. 30, 2017
Applicant:

Semiconductor Components Industries, Llc, Phoenix, AZ (US);

Inventors:

Jaroslav Hynecek, Allen, TX (US);

Bartosz Piotr Banachowicz, San Jose, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/355 (2011.01); H04N 5/378 (2011.01); H04N 5/353 (2011.01); H04N 5/359 (2011.01); H01L 27/146 (2006.01); H04N 5/363 (2011.01);
U.S. Cl.
CPC ...
H04N 5/3559 (2013.01); H01L 27/14612 (2013.01); H01L 27/14623 (2013.01); H01L 27/14636 (2013.01); H01L 27/14643 (2013.01); H04N 5/3535 (2013.01); H04N 5/3597 (2013.01); H04N 5/363 (2013.01); H04N 5/378 (2013.01);
Abstract

A global shutter image sensor may include an array of image sensor pixels. Each pixel may have a photodiode, a charge storage region, low light level circuitry and high light level circuitry. During high light level conditions, some charge generated by the photodiode may be diverted to the high light level circuitry and the remainder may be transferred to the low light level circuitry. During low light level conditions, all of the generated charge may be transferred to the low light level circuitry. A light shielding structure may be formed over the charge storage region. The circuit components of each pixel may be divided between first and second chips. By forming the components on separate chips and by implementing high light level circuitry, the size of the charge storage region may be reduced while preserving the high dynamic range and low noise of the image sensor during all illumination conditions.


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