The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2018

Filed:

Jun. 23, 2016
Applicant:

Xilinx, Inc., San Jose, CA (US);

Inventors:

Benjamin S. Devlin, San Francisco, CA (US);

Rafael C. Camarota, San Jose, CA (US);

Assignee:

XILINX, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 19/177 (2006.01); G01R 31/3177 (2006.01); G01R 31/317 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
H03K 19/17792 (2013.01); G01R 31/3177 (2013.01); G01R 31/31723 (2013.01); G01R 31/318541 (2013.01); G01R 31/318583 (2013.01); H03K 19/1776 (2013.01); H03K 19/17728 (2013.01);
Abstract

A circuit for implementing a scan chain in programmable resources of an integrated circuit is described. The circuit comprises a programmable element configured to receive an input signal and generate an output signal based upon the input signal; a selection circuit configured to receive the output signal generated by the programmable element at a first input and to receive a scan chain input signal at a second input, wherein the selection circuit generates a selected output signal in response to a selection circuit control signal; and a register configured to receive the selected output signal of the selection circuit.


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