The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2018
Filed:
Dec. 07, 2016
Canon Kabushiki Kaisha, Tokyo, JP;
Akihiro Yamada, Sakura, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
The present invention provides a measurement apparatus for measuring at least one of a position and an attitude of a work using an image obtained by capturing the work onto which pattern light having periodically arrayed lines is projected, including a determination unit configured to determine, based on luminance information about a period direction of luminance unevenness generated, due to periodic shape unevenness of the work, in the image obtained by an image capturing unit, a base-line direction defined by a relative tilt direction between an optical axis of a projection unit and an optical axis of the image capturing unit with respect to the work so that a period direction of the pattern light is different from a period direction of the shape unevenness of the work.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile